M
Minoru Doi
Researcher at Aichi Institute of Technology
Publications - 67
Citations - 1178
Minoru Doi is an academic researcher from Aichi Institute of Technology. The author has contributed to research in topics: Phase (matter) & Alloy. The author has an hindex of 16, co-authored 67 publications receiving 1077 citations. Previous affiliations of Minoru Doi include Nagoya Institute of Technology & Kyoto University.
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Journal ArticleDOI
The effect of elastic interaction energy on the morphology of γ′precipitates in nickel-based alloys
TL;DR: In this article, the elastic interaction between the ogdoad or double γ′ particles formed by the split reduces the total energy by overcoming the marked increase in surface energy due to the split.
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Elasticity effects on the microstructure of alloys containing coherent precipitates
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Microglia Activated with the Toll-Like Receptor 9 Ligand CpG Attenuate Oligomeric Amyloid β Neurotoxicity in in Vitro and in Vivo Models of Alzheimer’s Disease
Yukiko Doi,Tetsuya Mizuno,Yuki Maki,Shijie Jin,Hiroyuki Mizoguchi,Masayoshi Ikeyama,Minoru Doi,Makoto Michikawa,Hideyuki Takeuchi,Akio Suzumura +9 more
TL;DR: It is shown that oAbeta but not fibrillar Abeta was neurotoxic, and microglia activated with unmethylated DNA CpG motif (CpG), a ligand for Toll-like receptor 9, attenuated o Abeta1-42 neurotoxicity in primary neuron-microglia co-cultures, and it is proposed that C pG may be an effective therapeutic strategy for limiting oAbetas1- 42 neurot toxicity in AD.
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The effects of elastic interaction energy on the γ′ precipitate morphology of continuously cooled nickel-base alloys
TL;DR: In this article, the morphological change of ogdoads in Ni-Al, Ni-Si and Nimonic 115 alloys was investigated by means of transmission electron microscopy.
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Crystallization of amorphous germanium in an Al/a-Ge bilayer film deposited on a SiO2 substrate
TL;DR: In this paper, the authors examined the crystallization of amorphous Ge(a-Ge) in an Al (134 nm) and a-Ge (108 nm) thin-film bilayer deposited on a SiO2 substrate using a cross section transmission electron microscope technique.