scispace - formally typeset
M

Moon-Hyung Jang

Researcher at Yonsei University

Publications -  55
Citations -  1355

Moon-Hyung Jang is an academic researcher from Yonsei University. The author has contributed to research in topics: Thin film & Extended X-ray absorption fine structure. The author has an hindex of 15, co-authored 52 publications receiving 995 citations. Previous affiliations of Moon-Hyung Jang include University of Virginia & University of Massachusetts Amherst.

Papers
More filters
Journal ArticleDOI

Anatomy of Ag/Hafnia-Based Selectors with 10 10 Nonlinearity

TL;DR: High-resolution transmission electron microscopic analysis of the nanoscale crosspoint device suggests that elongation of an Ag nanoparticle under voltage bias followed by spontaneous reformation of a more spherical shape after power off is responsible for the observed threshold switching.
Journal ArticleDOI

Sub-10 nm Ta Channel Responsible for Superior Performance of a HfO2 Memristor.

TL;DR: A Ta/HfO2/Pt memristor with fast switching speed, record high endurance (120 billion cycles) and reliable retention, and directly observed a sub-10 nm Ta-rich and O-deficient conduction channel within the HfO1 layer that is responsible for the switching.
Journal ArticleDOI

Three-dimensional crossbar arrays of self-rectifying Si/SiO 2 /Si memristors

TL;DR: A fully foundry-compatible, all-silicon-based and self-rectifying memristor that negates the need for external selectors in large arrays, and exhibits repeatable unipolar resistance switching behaviour and excellent retention at 300 °C is demonstrated.
Journal ArticleDOI

Observing Oxygen Vacancy Driven Electroforming in Pt-TiO2-Pt Device via Strong Metal Support Interaction.

TL;DR: SMSI, which originates from the d-orbital overlap between Pt atom and the reduced cation of the insulating oxide in the vicinity of oxygen vacancies, was optimized by fabricating nanoscale devices causing Pt atom migration tracking the moving oxygen vacancy front from the anode to cathode during electroforming.
Journal ArticleDOI

Direct observation of metal-insulator transition in single-crystalline germanium telluride nanowire memory devices prior to amorphization

TL;DR: It is shown that the application of voltage pulses to single-crystalline GeTe nanowire memory devices introduces structural disorder in the form of dislocations and antiphase boundaries (APB) suggesting the role of electronic instabilities during the structural phase-change.