N
N. Selvakumar
Researcher at National Aerospace Laboratories
Publications - 36
Citations - 2289
N. Selvakumar is an academic researcher from National Aerospace Laboratories. The author has contributed to research in topics: Coating & Sputter deposition. The author has an hindex of 20, co-authored 35 publications receiving 2043 citations. Previous affiliations of N. Selvakumar include Indian Institute of Science.
Papers
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Review of physical vapor deposited (PVD) spectrally selective coatings for mid- and high-temperature solar thermal applications
TL;DR: In this paper, the state-of-the-art physical vapor deposited solar selective coatings used for solar thermal applications with an emphasis on sputter deposited coatings for high-temperature applications.
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A comparative study of reactive direct current magnetron sputtered CrAlN and CrN coatings
TL;DR: In this article, the structural and mechanical properties of CrN and CrAlN coatings were characterized using X-ray diffraction (XRD) and nanoindentation techniques, respectively.
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TiAlN∕TiAlON∕Si3N4 tandem absorber for high temperature solar selective applications
TL;DR: In this paper, a tandem absorber of TiAlN∕TiAlON∕Si3N4 is prepared using a magnetron sputtering process, which produces a film with a refractive index increasing from the surface to the substrate, which exhibits a high absorptance and a low emittance.
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Structure, optical properties and thermal stability of pulsed sputter deposited high temperature HfOx/Mo/HfO2 solar selective absorbers
TL;DR: In this article, a magnetron sputtering system was used to accelerate HfO x /Mo/HfO 2 on copper (Cu) and stainless steel (SS) substrates using an asymmetric bipolar-pulsed direct current generator.
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Deposition and characterization of TiAlN/TiAlON/Si3N4 tandem absorbers prepared using reactive direct current magnetron sputtering
TL;DR: In this article, a tandem absorber for solar spectrum reflectometer and emissometer, cross-sectional transmission electron microscopy (XTEM), selected area diffraction (SAD), X-ray photoelectron spectroscopy (XPS) and phase-modulated ellipsometry techniques was developed.