N
Nicola Nicolici
Researcher at McMaster University
Publications - 136
Citations - 3588
Nicola Nicolici is an academic researcher from McMaster University. The author has contributed to research in topics: Design for testing & Automatic test pattern generation. The author has an hindex of 32, co-authored 134 publications receiving 3528 citations. Previous affiliations of Nicola Nicolici include University of Southampton.
Papers
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Journal ArticleDOI
Scan architecture with mutually exclusive scan segment activation for shift- and capture-power reduction
TL;DR: A scan architecture with mutually exclusive scan segment activation which overcomes the shortcomings of previous approaches and achieves both shift and capture-power reduction with no impact on the performance of the design, and with minimal impact on area and testing time.
Journal ArticleDOI
Algorithms for State Restoration and Trace-Signal Selection for Data Acquisition in Silicon Debug
Ho Fai Ko,Nicola Nicolici +1 more
TL;DR: This paper presents accelerated algorithms for restoring circuit state elements from the traces collected during a debug session, by exploiting bitwise parallelism and introduces new metrics that guide the automated selection of trace signals, which can enhance the real-time observability during in-system debug.
Journal ArticleDOI
Variable-length input Huffman coding for system-on-a-chip test
TL;DR: This paper presents a new compression method for embedded core-based system-on-a-chip test based on a new variable-length input Huffman coding scheme, which proves to be the key element that determines all the factors that influence the TDCE parameters.
Proceedings ArticleDOI
Power-Aware Testing and Test Strategies for Low Power Devices
TL;DR: This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.
Proceedings ArticleDOI
Post-silicon validation opportunities, challenges and recent advances
TL;DR: An overview of the post-silicon validation problem and how it differs from traditional pre- silicon verification and manufacturing testing is provided.