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Nicolas Swiergiel
Researcher at Airbus Group
Publications - 6
Citations - 114
Nicolas Swiergiel is an academic researcher from Airbus Group. The author has contributed to research in topics: Digital image correlation & Feature detection (computer vision). The author has an hindex of 4, co-authored 6 publications receiving 98 citations.
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Analysis of image series through global digital image correlation
TL;DR: In this paper, the authors exploit the expected temporal regularity in the displacement fields to enhance the performance of a digital image correlation analysis, either in terms of spatial resolution, or in the terms of uncertainty.
Patent
Strain gauge, and system for spatially locating such gauges
TL;DR: A strain gauge as discussed by the authors is a substrate for mounting an element to be reversibly lengthened by a force applied while displaying a variation in the resistance thereof, the element lengthening itself along an axis for measurement by the gauge.
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Improving full-field identification using progressive model enrichments
TL;DR: In this article, a cyclic experiment on a dog-bone sample made of aluminum alloy is used as an example to identify the parameters of an elastoplastic model with exponential hardening and anisotropic yielding.
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Identification of In Situ Frictional Properties of Bolted Assemblies with Digital Image Correlation
TL;DR: In this paper, the authors used kinematic data provided by digital image correlation to analyze the change of the friction coefficient with the number of cycles of bolted assemblies. But they used displacement jump between the assembled plates, and the second one relies on displacement fields measured on the same surface.
Journal ArticleDOI
Calibrating thermoelastic stress analysis with integrated digital image correlation: Application to fatigue cracks:
TL;DR: In this paper, the dual use of digital image correlation and thermoelastic stress analyses for the study of propagating cracks is discussed, and it is shown that a few critical parameters such as emissivity, emissivities, and stress parameters are correlated.