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P. K. Kapur

Researcher at Amity University

Publications -  316
Citations -  4185

P. K. Kapur is an academic researcher from Amity University. The author has contributed to research in topics: Software quality & Software reliability testing. The author has an hindex of 28, co-authored 309 publications receiving 3663 citations. Previous affiliations of P. K. Kapur include Technical University of Denmark & University of Delhi.

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Book

Software Reliability Assessment with OR Applications

TL;DR: Software Reliability Assessment with OR Applications is a comprehensive guide to software reliability measurement, prediction, and control that provides a thorough understanding of the field and gives solutions to the decision-making problems that concern software developers, engineers, practitioners, scientists, and researchers.
Book

Contributions to Hardware and Software Reliability

TL;DR: Preliminary concepts and background replacement policies with minimal repairs problems with applications to computing systems software reliability growth models based on NHPP release policies numerical computations in renewal and reliability theory are presented.
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A software reliability growth model for an error-removal phenomenon

TL;DR: The authors develop a software reliability growth model based on the non-homogeneous Poisson process, under the assumption that the detection of these errors can also cause the Detection of some of the remaining errors without these errors causing any failure.
Journal ArticleDOI

A Unified Approach for Developing Software Reliability Growth Models in the Presence of Imperfect Debugging and Error Generation

TL;DR: This paper proposes two general frameworks for deriving several software reliability growth models based on a non-homogeneous Poisson process (NHPP) in the presence of imperfect debugging and error generation.
Journal ArticleDOI

Two Dimensional Multi-Release Software Reliability Modeling and Optimal Release Planning

TL;DR: An optimal release planning problem is formulated which minimizes the cost of testing of the release that is to be brought into market under the constraint of removing a desired proportion of faults from the current release.