There is a special reason for reviewing this book at this time: it is the 50th edition of a compendium that is known and used frequently in most chemical and physical laboratories in many parts of the world. Surely, a publication that has been published for 56 years, withstanding the vagaries of science in this century, must have had something to offer. There is another reason: while the book is a standard fixture in most chemical and physical laboratories, including those in medical centers, it is not as frequently seen in the laboratories of physician's offices (those either in solo or group practice). I believe that the Handbook can be useful in those laboratories. One of the reasons, among others, is that the various basic items of information it offers may be helpful in new tests, either physical or chemical, which are continuously being published. The basic information may relate

Handbook of Chemistry and Physics

A power conversion efficiency of 10.4% is demonstrated in planar CH3 NH3 PbBr3 hybrid solar cells without hysteresis of the J-V curve, by way of controlled crystallization in the spin-coating process. The high efficiency is attributed to the formation of a dense CH3 NH3 PbBr3 thin film by the introduction of HBr solution because the HBr increases the solubility of the CH3 NH3 PbBr3 and forms a thinner CH3 NH3 PbBr3 layer with full surface coverage.

Planar CH3NH3PbBr3 hybrid solar cells with 10.4% power conversion efficiency, fabricated by controlled crystallization in the spin-coating process.

Nanoscale structural information underlies research aimed at fabricating catalysts in a more controlled way. Surface science methods can provide that information, but the complexity of heterogeneous systems in general hinders the application of these methods to their full potential. In the last decades, a solution to this problem has been found in the use of model systems, ranging from well-defined single crystals of the supported phase to films or particles of that phase on flat or spherical model supports. In this paper, we review the literature on the latter model systems, that is, particles on a model support. Attention is payed to both preparation and use of such model systems.

https://pure.tue.nl/ws/files/1495087/617871.pdf

Surface Science Approach to Modeling Supported Catalysts

The important role that surface chemical analysis methods can and should play in the characterization of nanoparticles is described. The types of information that can be obtained from analysis of nanoparticles using Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), time-of-flight secondary-ion mass spectrometry (TOF-SIMS), low-energy ion scattering (LEIS), and scanning-probe microscopy (SPM), including scanning tunneling microscopy (STM) and atomic force microscopy (AFM), are briefly summarized. Examples describing the characterization of engineered nanoparticles are provided. Specific analysis considerations and issues associated with using surface-analysis methods for the characterization of nanoparticles are discussed and summarized, with the impact that shape instability, environmentally induced changes, deliberate and accidental coating, etc., have on nanoparticle properties.

Application of Surface Chemical Analysis Tools for Characterization of Nanoparticles

Simulations of the reaction kinetics on nanometer supported catalyst particles

https://pure.tue.nl/ws/files/1399089/617463.pdf

Deposition of inorganic salts from solution on flat substrates by spin-coating: theory, quantification and application to model catalysts

https://pure.tue.nl/ws/files/1402015/617872.pdf

Surface roughness effects in quantitative XPS: magic angle for determining overlayer thickness

https://pure.tue.nl/ws/files/1445858/617523.pdf

Thickness determination of uniform overlayers on rough substrates by angle-dependent XPS

Investigating the effect of a cleaner (used to remove lubrication oil residues) on the surface composition of rolled aluminium foils, we applied angle-dependent XPS to determine the thickness of the passivation layer on these foils. We found the simple uniform overlayer model, which has frequently been applied to translate XPS intensity ratios into a value for the overlayer thickness, to be inapplicable on these aluminium foils. However, data obtained from an Si(100) single-crystal surface were in rather good agreement with the model. SEM images from the aluminium foils show that their surface is rough on the (sub)micron scale. We believe this roughness to be the reason for the inapplicability of the uniform overlayer model. Simulations of XPS intensity ratios for model rough surfaces support this point of view. Both experiment and simulations make it clear that one should not base XPS thickness determinations on one measurement only, because in that case the applicability of the uniform overlayer model cannot be checked.

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Evaluation of take-off-angle-dependent XPS for determining the thickness of passivation layers on aluminium and silicon

Angle dependent x‐ray photoelectron spectroscopy, static secondary ion mass spectrometry, and scanning electron microscopy have been used to investigate the effect of a cleaning procedure on the composition, morphology and thickness of passivation layers on technical aluminum foils. The results show that the cleaner, a solution of sodium carbonate, phosphate and surfactants, not only removes undesirable oil contaminations efficiently, but also etches the surface. Because magnesium‐rich inclusions are etched at a faster rate than the surrounding aluminum, the foil acquires roughness on the scale of about 100 nm, whereas at the same time the surface composition changes. In particular, small amounts of phosphate are deposited on the surface. All these factors are considered favorable for improved adhesion.

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Take-off angle dependent x-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils

P. L. J. Gunter

Papers

Deposition of inorganic salts from solution on flat substrates by spin-coating: theory, quantification and application to model catalysts

Surface roughness effects in quantitative XPS: magic angle for determining overlayer thickness

Thickness determination of uniform overlayers on rough substrates by angle-dependent XPS

Evaluation of take-off-angle-dependent XPS for determining the thickness of passivation layers on aluminium and silicon

Take-off angle dependent x-ray photoelectron spectroscopy, secondary ion mass spectrometry, and scanning electron microscopy for determining the thickness and composition of passivation layers on technical aluminum foils