P
Peter Koidl
Researcher at Fraunhofer Society
Publications - 148
Citations - 6884
Peter Koidl is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Diamond & Quantum well. The author has an hindex of 42, co-authored 148 publications receiving 6689 citations. Previous affiliations of Peter Koidl include Lawrence Livermore National Laboratory.
Papers
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rf‐plasma deposited amorphous hydrogenated hard carbon thin films: Preparation, properties, and applications
TL;DR: In this article, the authors describe the deposition of amorphous hydrogenated hard carbon (a-C:H) thin films from benzene vapor in a rf plasma.
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Oriented CVD diamond films: twin formation, structure and morphology
TL;DR: In this article, three types of oriented diamond films, namely strongly fibre textured, epitaxially textured and homoepitaxial, were studied under various growth conditions and the structure and morphology of the films were shown to depend on a growth parameter α which is given by the relative growth rates on {100} and {111} facets.
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Hard carbon coatings with low optical absorption
TL;DR: In this article, the optical gap depends linearly on hydrogen content and Eopt can be varied between 0.8 and 1.8 eV, where sp3 (single) and sp2 (double) C-C bonds dominate.
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Chemical vapour deposition and characterization of smooth {100}-faceted diamond films
Christoph Wild,Peter Koidl,W. Müller-Sebert,H. Walcher,R. Kohl,N. Herres,R. Locher,R. Samlenski,R. Brenn +8 more
TL;DR: In this article, a two-step growth process based on the control of α permits the independent optimization of texture axis and surface morphology, offering the possibility to obtain smooth faceted diamond films for arbitrary film thickness.
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Texture formation in polycrystalline diamond films
Ch. Wild,N. Herres,Peter Koidl +2 more
TL;DR: In this paper, the structure and morphology of polycrystalline diamond films prepared by chemical vapor deposition (CVD) have been studied using x-ray texture analysis, angle-resolved optical reflection, and scanning electron microscopy.