Showing papers by "Petko Vitanov published in 1983"
TL;DR: In this article, a new method for determining the interface trap distribution is described, which reveals trap densities as low as 2×108 cm−2 eV−1 and is applicable to samples with nonuniform doping concentrations.
Abstract: A new method for determining the interface trap distribution is described. The measurements are performed on n‐channel metal‐oxide‐semiconductor field‐effect transistors and yield the densities of interface traps near the minority carrier band (0.04
2 citations