From the Publisher:
This is the first comprehensive treatment of feed-forward neural networks from the perspective of statistical pattern recognition. After introducing the basic concepts, the book examines techniques for modelling probability density functions and the properties and merits of the multi-layer perceptron and radial basis function network models. Also covered are various forms of error functions, principal algorithms for error function minimalization, learning and generalization in neural networks, and Bayesian techniques and their applications. Designed as a text, with over 100 exercises, this fully up-to-date work will benefit anyone involved in the fields of neural computation and pattern recognition.

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Neural networks for pattern recognition

https://ai.stanford.edu/~ronnyk/wrappersPrint.pdf

Wrappers for feature subset selection

The primary goal of pattern recognition is supervised or unsupervised classification. Among the various frameworks in which pattern recognition has been traditionally formulated, the statistical approach has been most intensively studied and used in practice. More recently, neural network techniques and methods imported from statistical learning theory have been receiving increasing attention. The design of a recognition system requires careful attention to the following issues: definition of pattern classes, sensing environment, pattern representation, feature extraction and selection, cluster analysis, classifier design and learning, selection of training and test samples, and performance evaluation. In spite of almost 50 years of research and development in this field, the general problem of recognizing complex patterns with arbitrary orientation, location, and scale remains unsolved. New and emerging applications, such as data mining, web searching, retrieval of multimedia data, face recognition, and cursive handwriting recognition, require robust and efficient pattern recognition techniques. The objective of this review paper is to summarize and compare some of the well-known methods used in various stages of a pattern recognition system and identify research topics and applications which are at the forefront of this exciting and challenging field.

/pdf/statistical-pattern-recognition-a-review-1kz1b0tte4.pdf

Statistical pattern recognition: a review

Planning algorithms are impacting technical disciplines and industries around the world, including robotics, computer-aided design, manufacturing, computer graphics, aerospace applications, drug design, and protein folding. This coherent and comprehensive book unifies material from several sources, including robotics, control theory, artificial intelligence, and algorithms. The treatment is centered on robot motion planning but integrates material on planning in discrete spaces. A major part of the book is devoted to planning under uncertainty, including decision theory, Markov decision processes, and information spaces, which are the “configuration spaces” of all sensor-based planning problems. The last part of the book delves into planning under differential constraints that arise when automating the motions of virtually any mechanical system. Developed from courses taught by the author, the book is intended for students, engineers, and researchers in robotics, artificial intelligence, and control theory as well as computer graphics, algorithms, and computational biology.

Planning Algorithms: Introductory Material

We develop a common theoretical framework for combining classifiers which use distinct pattern representations and show that many existing schemes can be considered as special cases of compound classification where all the pattern representations are used jointly to make a decision. An experimental comparison of various classifier combination schemes demonstrates that the combination rule developed under the most restrictive assumptions-the sum rule-outperforms other classifier combinations schemes. A sensitivity analysis of the various schemes to estimation errors is carried out to show that this finding can be justified theoretically.

On combining classifiers

Pattern recognition : a statistical approach

Baum's forward-backward algorithm revisited

Statistical pattern recognition is now a mature discipline which has been successfully applied in several application domains. The primary goal in statistical pattern recognition is classification, where a pattern vector is assigned to one of a finite number of classes and each class is characterized by a probability density function on the measured features. A pattern vector is viewed as a point in the multidimensional space defined by the features. Design of a recognition system based on this paradigm requires careful attention to the following issues: type of classifier (single-stage vs. hierarchical), feature selection, estimation of classification error, parametric vs. nonparametric decision rules, and utilizing contextual information. Current research emphasis in pattern recognition is on designing efficient algorithms, studying small sample properties of various estimators and decision rules, implementing the algorithms on novel computer architecture, and incorporating context and domain-specific knowledge in decision making.

Pattern recognition theory and applications

From the Publisher:
Concerns the separation of objects from their background--a major problem in pattern recognition. This unique monograph outlines--down to the code level--an algorithmic approach to the real-time detection of connected components in binary pictures acquired in a raster-scan fashion.

Connected components in binary images: The detection problem

In this paper, we address the pixel labeling problem under the assumption that contextual information in the picture is encoded in the transition probabilities of a second order Markov mesh random field. We show that the exponential complexity of the problem can be overcome by the virtue of a truly innocuous assumption that leads to a virtually optimal solution expressed in terms of a non-linear recurrence relation. We derive linear-time algorithms for computing the joint likelihood of the pixel label and past and present (and some look-ahead) image measurements. The smoothing and segmentation of coarsely quantized pictures are taken as example-problems to validate our assumption and demonstrate the effectiveness of the technique proposed.

Pierre A. Devijver

Papers

Pattern recognition : a statistical approach

Baum's forward-backward algorithm revisited

Pattern recognition theory and applications

Connected components in binary images: The detection problem

Probabilistic labeling in a hidden second order markov mesh