R
R. Arendsen
Researcher at NXP Semiconductors
Publications - 1
Citations - 338
R. Arendsen is an academic researcher from NXP Semiconductors. The author has contributed to research in topics: Test data & Design for testing. The author has an hindex of 1, co-authored 1 publications receiving 336 citations.
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Proceedings ArticleDOI
A structured and scalable mechanism for test access to embedded reusable cores
TL;DR: This paper presents the concept of a structured test access mechanism for embedded cores: test data access from chip pins to TESTSHELL and vice versa is provided by the TESTRAIL, while the operation of the TEStsHELL is controlled by a dedicated test control mechanism (TCM).