Multiple dependent state sampling plans for lot acceptance based on measurement data

This paper extends the idea of multiple dependent state sampling plans to the case of using process capability index when the quality characteristic of the product follows the normal distribution. The plan parameters are determined using the optimization process with minimum values of sample size so that the specified producer’s risk and consumer’s risk should be satisfied simultaneously for given values of acceptable quality level and limiting quality level in terms of fraction defective beyond two specification limits. The plan parameters are determined under symmetric and asymmetric cases of fraction defective. The advantage of the proposed plan is discussed over the single variable sampling plan. A real example is presented to illustrate the proposed plan in practice.

Multiple Dependent State Sampling Plan Based on Process Capability Index

In this paper, we will present a control chart for exponentially distributed quality characteristics using multiple dependent state sampling. The proposed control chart has double control limits with two control coefficients, which is based on a normal approximation through transformation. The control coefficients are determined by considering the average run length (ARL) when the process is in control. The ARL for the shifted process is reported according to various shift ratios. The efficiency of the proposed control chart over the existing t-chart is compared in terms of the ARL.

A control chart for an exponential distribution using multiple dependent state sampling

In the literature, multiple dependent state variable sampling plans are available that does not constitute the process loss and hence are unable to distinguish among the product that falls within or outside specification limits. In this manuscript, the multiple dependent state variable sampling plans with process loss consideration are proposed. The designed parameters of the proposed plan are found by satisfying the vendor and buyer risks at various acceptable quality level and limiting quality level. The advantages of the proposed plan are discussed compared with the existing plans using the process loss function (Yen and Chang Commun Stat: Simul Comput 38:1579–1591, 2009) and Aslam et al. (Commun Stat-Theor Method 41:3633–3647, 2012). A real industrial example is included to illustrate the proposed plan.

Multiple dependent state variable sampling plans with process loss consideration

This paper proposes a new np control chart by utilizing the information on the past subgroups through the idea of multiple dependent state sampling. The proposed control chart has two pairs of cont...

A new attribute control chart using multiple dependent state sampling

Tables have been prepared for the construction and selection of multiple dependent (deferred) state (MDS) sampling plans of type MDS-(c1,c2). These plans are compared with conventional sampling plans (such as single and double sampling) and it is shown that MDS-type plans require a smaller sample size. A special feature of the MDS-(0,1) plan is highlighted and its design procedure is indicated.

Construction and selection of multiple dependent (deferred) state sampling plan

This paper presents a design for skip-lot sampling inspection plans with the double-sampling plan as the reference plan, so as to reduce the sample size and produce more efficient plans in return for the same sampling effort. The efficiency of the proposed plan compared with that of the conventional double-sampling plan is also discussed. The need for smaller acceptance numbers under the plan is highlighted. Methods of selecting the plan indexed by the acceptable quality level and limiting quality level, and by the acceptable quality level and average outgoing quality level are also presented.

Design and evaluation of skip-lot sampling inspection plans with double-sampling plan as the reference plan

Designing multiple-deferred state MDS-1(0, 2) sampling plans indexed by Acceptable Quality Level (AQL) and Limiting Quality Level (LQL) is discussed. Tables are presented using which, one can select MDS-1 (0, 2) plan involving minimum risks.

On designing multiple deferred state sampling (MDS-1 (0, 2)) plans involving minimum risks

A table is presented for the construction and selection of tightened-normal-tightened sampling scheme of type TNT-(n1, n2;c). Efficiency of TNT-(n1, n2;c) scheme over conventional single and double sampling plans is discussed.

Construction and selection of tightened-normal-tightened sampling inspection scheme of type TNT-(n1, n2; c)

The readily available acceptance number value is revised in the form of three tables. From these tables it is possible to determine single or chain sampling inspection plans when the sample size is fixed. These tables replace the large number of existing tables in use.

R. Vijayaraghavan

Papers

Construction and selection of multiple dependent (deferred) state sampling plan

Design and evaluation of skip-lot sampling inspection plans with double-sampling plan as the reference plan

On designing multiple deferred state sampling (MDS-1 (0, 2)) plans involving minimum risks

Construction and selection of tightened-normal-tightened sampling inspection scheme of type TNT-(n1, n2; c)

Designing Sampling Inspection Plans When the Sample Size is Fixed