R
Rajkumar Bhimgonda Patil
Researcher at University of Maryland, College Park
Publications - 25
Citations - 142
Rajkumar Bhimgonda Patil is an academic researcher from University of Maryland, College Park. The author has contributed to research in topics: Reliability (semiconductor) & Maintainability. The author has an hindex of 4, co-authored 15 publications receiving 83 citations. Previous affiliations of Rajkumar Bhimgonda Patil include Massachusetts Institute of Technology & College of Engineering, Pune.
Papers
More filters
Journal ArticleDOI
Reliability analysis and life cycle cost optimization: a case study from Indian industry
TL;DR: In this article, a case study describing reliability analysis and life cycle cost optimization of a band saw cutting machine manufactured and used in India is presented, where the reliability analysis is required to identify the components or subsystems with low reliability for a given designed performance.
Journal ArticleDOI
Reliability analysis of CNC turning center based on the assessment of trends in maintenance data: A case study
TL;DR: In this paper, the reliability, maintainability and life cycle cost (LCC) analysis of a computerized numerical control (CNC) turning center which is manufactured and used in India is presented.
Journal ArticleDOI
Selection of time-to-failure model for computerized numerical control turning center based on the assessment of trends in maintenance data
TL;DR: A generalized framework for selection of time-to-failure model based on the assessment of trends in failure and repair time data is provided and spindle system, computerized numerical control system, electrical and electronic system, hydraulic system and cooling system are found to be critical from reliability and maintainability point of view.
Journal ArticleDOI
Failure Modes and Effects Analysis (FMEA) of Computerized Numerical Control (CNC) Turning Center
TL;DR: FMEA methodology is used to analyze the risk involved in the operation of CNC turning centers to identify critical failure modes, components and sub-systems and results are useful for system reliability improvement and optimizing maintenance.
Journal ArticleDOI
Integrated reliability and maintainability analysis of Computerized Numerical Control Turning Center considering the effects of human and organizational factors
TL;DR: The reliability and maintainability analysis reveals that the Weibull is the best-fit distribution for time-between-failure data, whereas log-normal is the fastest-fitting distribution for Time-To-Repair data.