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Robert H. Mullis

Researcher at Aptina

Publications -  46
Citations -  1786

Robert H. Mullis is an academic researcher from Aptina. The author has contributed to research in topics: Lens (optics) & Pixel. The author has an hindex of 15, co-authored 46 publications receiving 1770 citations. Previous affiliations of Robert H. Mullis include Micron Technology.

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Patent

Capturing and processing of images using monolithic camera array with heterogeneous imagers

TL;DR: In this paper, the system and methods for implementing array cameras configured to perform super-resolution processing to generate higher resolution super-resolved images using a plurality of captured images and lens stack arrays that can be utilized in array cameras are disclosed.
Journal ArticleDOI

PiCam: an ultra-thin high performance monolithic camera array

TL;DR: PiCam (Pelican Imaging Camera-Array), an ultra-thin high performance monolithic camera array, that captures light fields and synthesizes high resolution images along with a range image (scene depth) through integrated parallax detection and superresolution is presented.
Patent

Method and apparatus for extended depth-of-field image restoration

TL;DR: In this article, a method and apparatus for restoring an image captured through an extended depth-of-field lens is described, where preprocessed data relating to image degradation is stored and used during an image restoration process.
Patent

Extended Color Processing on Pelican Array Cameras

TL;DR: In this article, a method for extended color processing on Pelican array cameras is described, where a first set of images includes information in a first band of visible and non-visible wavelengths and a second set of image features include information in both bands.
Patent

System and methods for calibration of an array camera using a single captured image

TL;DR: In this paper, a system and methods for calibrating an array camera in accordance with a test pattern with the array camera such that each imaging component captures an image of the test pattern is disclosed.