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Showing papers by "Robert S Averback published in 2002"


Journal ArticleDOI
TL;DR: In this article, an analytical interatomic potential for modeling platinum, carbon, and the platinum-carbon interaction using a single functional form is proposed, which makes use of the fact that chemical bonding in both covalent systems and d-transition metals can be described in terms of the Pauling bond order.
Abstract: We propose an analytical interatomic potential for modeling platinum, carbon, and the platinum-carbon interaction using a single functional form The ansatz chosen for this potential makes use of the fact that chemical bonding in both covalent systems and d-transition metals can be described in terms of the Pauling bond order By adopting Brenner's original bond-order potential for carbon [Phys Rev B 42, 9458 (1990)] we devise an analytical expression that has an equivalent form for describing the C-C/Pt-Pt/Pt-C interactions It resembles, in the case of the pure metal interaction, an embedded-atom scheme, but includes angularity The potential consequently provides an excellent description of the properties of Pt including the elastic anisotropy ratio The parameters for both the Pt-Pt interaction and the Pt-C interaction are systematically adjusted using a combination of experimental and theoretical data, the latter being generated by total-energy calculations based on density-functional theory This approach offers good chemical accuracy in describing all types of interactions, and has a wide applicability for modeling metal-semiconductor systems

164 citations


Journal ArticleDOI
TL;DR: In this article, the authors used atomic force microscopy and cross-sectional transmission electron microscopy to characterize the evolution of nanoparticle/substrate interfaces during heavy-ion bombardment.
Abstract: Atomic force microscopy and cross-sectional transmission electron microscopy are used to characterize the evolution of nanoparticle/substrate interfaces during heavy-ion bombardment. Pt nanoparticles, prepared by annealing 3 A Pt films on SiO2, embed into the substrates following 800 keV Kr+ irradiation. For Pt particles with diameters 5–20 nm, the depth of the embedding increases with an ion dose until the particles are fully submerged at a dose of ∼1016 cm−2. The results are explained by capillary driving forces and an ion-induced viscous flow of amorphous SiO2. The irradiation-induced viscosity of SiO2 needed to explain our results is ∼0.9×1023 Pa ion cm−2, consistent with previous measurements using stress relaxation. Similar results are obtained for 10 keV He+ irradiation, suggesting that ion-induced viscosity arises from localized defects rather than from the creation of large melt zones. The embedding of Pt particles is inhibited, however, for energetically unfavorable substrates such as alumina.

44 citations


12 Nov 2002
TL;DR: The Jet Propulsion Laboratory has been actively pursuing the development of thermoelectric micro/nanodevices that can be fabricated using a combination of electrochemical deposition and integrated circuit processing techniques as mentioned in this paper.
Abstract: The Jet Propulsion Laboratory has been actively pursuing the development of thermoelectric micro/nanodevices that can be fabricated using a combination of electrochemical deposition and integrated circuit processing techniques

2 citations