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Robert Tsu
Researcher at Texas Instruments
Publications - 52
Citations - 1116
Robert Tsu is an academic researcher from Texas Instruments. The author has contributed to research in topics: Layer (electronics) & Dielectric. The author has an hindex of 18, co-authored 52 publications receiving 1113 citations. Previous affiliations of Robert Tsu include University of Illinois at Urbana–Champaign & University of Texas at Austin.
Papers
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Patent
Integrated circuit capacitor
TL;DR: The use of different materials for different conductive films forming plates or electrodes of one or more capacitors formed in a trench in a body of semiconductor materials allow connections to be made selectively to the plates.
Proceedings ArticleDOI
Leakage and breakdown reliability issues associated with low-k dielectrics in a dual-damascene Cu process
TL;DR: In this paper, the leakage and TDDB of low-k dielectrics are investigated in a dual-damascene Cu/low-k process flow and the authors show that moisture absorption by these lowk materials serves to increase the dielectric constant, increase the leakage, and reduce the breakdown strength.
Patent
Method of making barium strontium titanate (BST) thin film by erbium donor doping
Robert Tsu,Bernard M. Kulwicki +1 more
TL;DR: In this paper, a semiconductor device and process for making the same are disclosed which incorporate a relatively large percentage of erbium dopant (1 to 5%) into a BST dielectric film 24 with small grain size (e.g. 10 nm to 50 nm).
Journal ArticleDOI
Scanning-tunneling-microscopy studies of disilane adsorption and pyrolytic growth on Si(100)-(2x1).
TL;DR: Scanning tunneling microscopy has been employed to study the adsorption of disilane and pyrolytic growth on Si(100)-(2{times}1) at various temperatures, and results are strikingly similar to those reported for growth by molecular-beam epitaxy using pure Si, even though different surface reactions are involved.
Journal ArticleDOI
Direct current conduction properties of sputtered Pt/(Ba0.7Sr0.3)TiO3/Pt thin films capacitors
TL;DR: In this paper, the voltage and time dependence of the polarization current can be modeled by a distribution of Debye-type relaxations, where the relaxation time and capacitance derived from current-time measurements were applied to simulate the currentvoltage behavior, where good fitting to experimental result was obtained.