R
Robley C. Williams
Researcher at University of Michigan
Publications - 10
Citations - 512
Robley C. Williams is an academic researcher from University of Michigan. The author has contributed to research in topics: Conventional transmission electron microscope & Scanning transmission electron microscopy. The author has an hindex of 6, co-authored 10 publications receiving 498 citations.
Papers
More filters
Journal ArticleDOI
Applications of Metallic Shadow‐Casting to Microscopy
TL;DR: In this paper, the authors discussed the factors which determine image contrast in optical and electron micrographs and proposed a shadow casting technique whereby the contrast of images is greatly increased by depositing obliquely a thin film of metal on the microscope preparations.
Journal ArticleDOI
The Thickness of Electron Microscopic Objects
Journal ArticleDOI
Electron Shadow-Micrography of Virus Particles.
TL;DR: A new procedure is described for the electron microscopy of small objects that involves the oblique evaporation of a thin film of metal over the preparation before micrography, which produces new information about the heights and shapes of objects seen in the preparation.
Journal ArticleDOI
Electron shadow micrography of the tobacco mosaic virus protein.
TL;DR: Two improvements are described in the use of shadow electron micrography for the observation of particles of macromolecular dimensions that involve the substitution of gold for chromium as shadowing metal and metal-shadowing small particles deposited on a very smooth surface such as that of polished glass.
Journal ArticleDOI
Electron Shadow-Micrographs of Hæmocyanin Molecules
TL;DR: The present communication describes experiments carried out on a hæmocyanin, where the visibility of small objects appearing in preparations has been so greatly enhanced by the shadowing technique that it was led to apply it to the photography of the elementary particles, or molecules, of a number of proteins and high polymeric substances.