R
Ron Gurwitz
Researcher at Ben-Gurion University of the Negev
Publications - 5
Citations - 328
Ron Gurwitz is an academic researcher from Ben-Gurion University of the Negev. The author has contributed to research in topics: Surface photovoltage & Photoconductivity. The author has an hindex of 4, co-authored 5 publications receiving 281 citations.
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Photoinduced oxygen release and persistent photoconductivity in ZnO nanowires
TL;DR: The adsorption-desorption balance is fully recovered after the ZnO surface is exposed to air, which suggests that under UV illumination, theZnOsurface is actively "breathing" oxygen, a process that is further enhanced in nanowires by their high surface to volume ratio.
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Interaction of light with the ZnO surface: Photon induced oxygen "breathing," oxygen vacancies, persistent photoconductivity, and persistent photovoltage
TL;DR: In this article, the authors observed a decomposition of ZnO under white light and formation of oxygen-depleted surface, which explains photoconductivity by the electron donation of oxygen vacancies.
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Method for electrical characterization of nanowires.
Ron Gurwitz,Ilan Shalish +1 more
TL;DR: This paper proposes a method that combines resistivity and photovoltage measurements with a chemical perturbation to the surface to measure carrier concentration and mobility, as a function of wire diameter, and also to measure the surface state density and the surface band bending before and after the chemical treatment.
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Bandgap and band discontinuity in wurtzite/zincblende GaAs homomaterial heterostructure
Ron Gurwitz,Asa Tavor,Liran Karpeles,Ilan Shalish,Wei Yi,Georgiy Seryogin,Venkatesh Narayanamurti +6 more
TL;DR: In this paper, a wurtzite GaAs epilayer grown on a zincblende GaAs substrate by metalorganic chemical vapor deposition is studied by surface photovoltage spectroscopy.
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High-temperature gold metallization for ZnO nanowire device on a SiC substrate
TL;DR: In this paper, a sputter-deposited Ti-Si-N ternary diffusion barrier layer and a Ti adhesion layer between the top gold layer and 4H-SiC substrate were used to improve the survivability of a gold metallization for nanowire devices incorporating ZnO nanowires atop a SiC substrate.