Showing papers by "Rong Wang published in 1999"

Absolute measurement of penetration depth in a superconducting film by the two-coil technique

Abstract: A two-coil mutual-inductance apparatus that is optimized to allow for the measurement of the absolute value of penetration depth λ in superconducting films is described. Nb films with thickness d ranging from 20 to 90 nm are used to illustrate the measurement. For a 70-nm-thick Nb film at 4.2 K, with d/λ∼0.6, the uncertainty in the measured λ is about ±2.3%. From the results on the Nb film series, we show that a satisfactory determination of the absolute value of λ is possible for these films with d/λ<0.95.