Showing papers by "S. Di Carlo published in 2005"
08 Nov 2005
TL;DR: Comparison results show that the proposed March tests provide the same fault coverage of the known ones, but they reduce the test complexity, and therefore the test time.
Abstract: Among the different types of algorithms proposed to test static random access memories (SRAMs), March tests have proven to be faster, simpler and regularly structured. New memory production technologies introduce new classes of faults usually referred to as dynamic memory faults. A few March tests for dynamic fault, with different fault coverage, have been published. In this paper, we propose new March tests targeting unlinked dynamic faults with lower complexity than published ones. Comparison results show that the proposed March tests provide the same fault coverage of the known ones, but they reduce the test complexity, and therefore the test time
44 citations
22 May 2005
TL;DR: A new approach is proposed to automatically generate March tests with minimal length for both static and dynamic faults, resorts to a formal model to represent faulty behaviors in a memory and to simplify the generation of the corresponding tests.
Abstract: New memory production modern technologies introduce new classes of faults usually referred to as dynamic memory faults. Although some hand-made March tests to deal with these new faults have been published, the problem of automatically generate March tests for dynamic faults has still to be addressed, in this paper we propose a new approach to automatically generate March tests with minimal length for both static and dynamic faults. The proposed approach resorts to a formal model to represent faulty behaviors in a memory and to simplify the generation of the corresponding tests.
27 citations