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S. Geckeler

Researcher at Siemens

Publications -  8
Citations -  21

S. Geckeler is an academic researcher from Siemens. The author has contributed to research in topics: Dispersion (optics) & Waveguide (optics). The author has an hindex of 3, co-authored 8 publications receiving 21 citations.

Papers
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Journal ArticleDOI

Compensation of profile dispersion in graded-index optical fibres

TL;DR: In this article, a profile function that compensates for a broad class of profile dispersions is presented, which may become a design criterion for fibres in the future, although its practical applicability is presently restricted by the limited variety of available glasses.
Journal ArticleDOI

Nonlinear profile dispersion aids optimisation of graded-index fibres

TL;DR: In this paper, an efficient method is presented to minimize total dispersion by matching the distortions of the refractive profile and nonlinear profile dispersion caused by the dependence of the profile shape on wavelength, which simplifies the calculation of pulse broadening in imperfect real fibres.
Journal ArticleDOI

Dispersion in optical waveguides with graded refractive index

TL;DR: In this article, the authors report a discrepancy between the results of ray-optical and wave-optically optimized optical fibres, showing that helical rays may occur with a much larger transit-time spread than the modes computed with the WKB method.
Patent

Gradient optical fiber

TL;DR: A gradient optical fiber with an optimized index of refraction profile characterized by the normalized difference in the index of re-correlation Δ is in a range of 0.005 to 0.011, with -(k o /Δ·dΔ/dk o ) having a range between 0.09 and 0.11, and g having a profile dispersion function F N according to F N =f g wherein α is in the range of 2.4 to 2.6.
Journal ArticleDOI

Group delay in graded-index fibres with non-power-law refractive profiles

TL;DR: In this article, a new method for the calculation of group delay which has a simplicity similar to that of the Gloge?Marcatili method and can be used in conjunction therewith as an easy way of finding reliable results for non-power-law refractive profiles.