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S. W. Russell

Researcher at Arizona State University

Publications -  30
Citations -  558

S. W. Russell is an academic researcher from Arizona State University. The author has contributed to research in topics: Rutherford backscattering spectrometry & Thin film. The author has an hindex of 11, co-authored 30 publications receiving 543 citations. Previous affiliations of S. W. Russell include Texas Instruments.

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Enhanced adhesion of copper to dielectrics via titanium and chromium additions and sacrificial reactions

TL;DR: In this paper, the authors measured the force required to separate films from substrates by scratch testing and found that the force decreases with temperature on all substrates, generally exhibiting better adhesion on SiO2 than on PSG or BPSG.
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Chemical and Structural Evolution of Sol-Gel-Derived Hydroxyapatite Thin Films under Rapid Thermal Processing

TL;DR: In this paper, the chemical and structural evolution of hydroxyapatite thin films produced by sol-gel synthesis is characterized by ion beam analysis, X-ray diffraction, and Fourier transform infrared spectroscopy.
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In situ observation of fractal growth during a‐Si crystallization in a Cu3Si matrix

TL;DR: In this article, the authors observed that the crystallization of amorphous Si thin films in contact with a copper silicide layer occurs at a temperature of around 485°C in the form of dendrites with a fractal dimension of 1.7.
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Observation and prediction of first phase formation in binary Cu‐metal thin films

TL;DR: In this article, the first phase formation of binary thin film systems with 14 different types of Cu/metal bilayers was determined using transmission electron microscopy and Rutherford backscattering spectrometry.
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Reaction kinetics in the Ti/SiO2 system and Ti thickness dependence on reaction rate

TL;DR: The reaction kinetics of Ti films on SiO2 were investigated using Rutherford backscattering spectrometry, x-ray diffraction, Auger electron spectroscopy, and transmission electron microscopy as discussed by the authors.