S
Saeed Peyghami
Researcher at Aalborg University
Publications - 58
Citations - 739
Saeed Peyghami is an academic researcher from Aalborg University. The author has contributed to research in topics: Electric power system & Reliability (semiconductor). The author has an hindex of 9, co-authored 57 publications receiving 289 citations.
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Journal ArticleDOI
An Overview on the Reliability of Modern Power Electronic Based Power Systems
TL;DR: It can be seen that reliability assessment of modern power systems also requires introducing local reliability concepts as well as incorporating different electro-magnetic/mechanical stability issues.
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A Guideline for Reliability Prediction in Power Electronic Converters
TL;DR: The proposed comprehensive failure function over the useful lifetime and wear-out phase can be used for optimal design and manufacturing by identifying the failure prone components and end-of-life prediction and can be use for optimal decision-making in design, planning, operation, and maintenance of modern power electronic-based power systems.
Journal ArticleDOI
Incorporating Power Electronic Converters Reliability Into Modern Power System Reliability Analysis
TL;DR: An accurate converter reliability model is, in some cases, required for reliability assessment and management in modern power systems, because of a high calculation burden raised by the physics of failure analysis for large-scale power electronic systems.
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System-Level Reliability-Oriented Power Sharing Strategy for DC Power Systems
TL;DR: The aim of this paper is to extend the aging process of failure prone converters by adjusting their loadings by employing the prior experienced thermal damages on the converter's fragile components in order to adjust its contribution on demand supply.
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Mission-Profile-Based System-Level Reliability Analysis in DC Microgrids
TL;DR: This paper provides a system-level reliability insight for design, control, and operation of multiconverter system by extending the mission-profile-based reliability estimation approach and indicates the failure-prone converters from wear out perspective.