S
Salah Boussaad
Researcher at DuPont
Publications - 64
Citations - 1516
Salah Boussaad is an academic researcher from DuPont. The author has contributed to research in topics: Carbon nanotube & Polyimide. The author has an hindex of 20, co-authored 64 publications receiving 1484 citations. Previous affiliations of Salah Boussaad include University of Miami & Florida International University.
Papers
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High-resolution multiwavelength surface plasmon resonance spectroscopy for probing conformational and electronic changes in redox proteins.
TL;DR: It is demonstrated here that a high-resolution multiwavelength SPR technique can measure the electronic states of the molecules and thus allow direct identification of the atoms or molecules through surface plasmon resonance spectroscopy.
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In situ detection of cytochrome c adsorption with single walled carbon nanotube device
TL;DR: In this paper, the in situ detection of cytochrome c adsorption on individual SWNT transistors via the changes in the electron transport properties of the transistors was reported.
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High resolution surface plasmon resonance spectroscopy
TL;DR: In this paper, a method for detecting surface plasmon resonance with high resolution (∼10−5 degrees or ∼10−8 refractive index units) and fast response time (1 μs) is described.
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Atom-size gaps and contacts between electrodes fabricated with a self-terminated electrochemical method
Salah Boussaad,Nongjian Tao +1 more
TL;DR: In this article, the authors describe a method to fabricate atomic-scale gaps and contacts between two metal electrodes using a directional electrodeposition process and a built-in self-termination mechanism.
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Electron Transfer and Adsorption of Myoglobin on Self-Assembled Surfactant Films: An Electrochemical Tapping-Mode AFM Study
Salah Boussaad,Nongjian Tao +1 more
TL;DR: In this article, the authors studied myoglobin on graphite basal plane and on self-assembled didodecyldi- methylammonium bromide (DDAB) mono-and multilayers with in situ tapping-mode AFM, cyclic voltammetry, and differential capacitance measurements.