S
Samuel T. Thurman
Researcher at The Institute of Optics
Publications - 53
Citations - 2415
Samuel T. Thurman is an academic researcher from The Institute of Optics. The author has contributed to research in topics: Fourier transform & Fourier transform spectroscopy. The author has an hindex of 14, co-authored 53 publications receiving 2019 citations. Previous affiliations of Samuel T. Thurman include University of Rochester.
Papers
More filters
Journal ArticleDOI
Efficient subpixel image registration algorithms
TL;DR: Three new algorithms for 2D translation image registration to within a small fraction of a pixel that use nonlinear optimization and matrix-multiply discrete Fourier transforms are compared to evaluate a translation-invariant error metric.
Journal ArticleDOI
Controlling the spectral response in guided-mode resonance filter design
TL;DR: Techniques for controlling spectral width are used in conjunction with thin-film techniques in the design of guided-mode resonance filters to provide simultaneous control over line-shape symmetry, sideband levels, and spectral width.
Journal ArticleDOI
Phase-error correction in digital holography
TL;DR: Computer simulations used to compare the performance of digital shearing laser interferometry and various sharpness metrics for the correction of phase errors when imaging a diffuse object found phase errors better than lambda/50 root-mean-square (RMS).
Journal ArticleDOI
Phase retrieval with signal bias
TL;DR: Simulation results indicate that the root-mean-square error of the retrieved phase can be more sensitive to an unaccounted-for signal bias than to random noise in practical scenarios.
Journal ArticleDOI
Interferometric imaging using Si 3 N 4 photonic integrated circuits for a SPIDER imager
Tiehui Su,Guangyao Liu,Badham Katherine Emily,Samuel T. Thurman,Richard L. Kendrick,Alan L. Duncan,Danielle M. R. Wuchenich,Chad Ogden,Guy Chriqui,Shaoqi Feng,Jaeyi Chun,Weicheng Lai,S.J.B. Yoo +12 more
TL;DR: The design, fabrication, and experimental demonstration of a silicon nitride photonic integrated circuit (PIC) capable of conducting one-dimensional interferometric imaging with twelve baselines near λ = 1100-1600 nm is reported.