S
Savir
Researcher at IBM
Publications - 11
Citations - 600
Savir is an academic researcher from IBM. The author has contributed to research in topics: Stuck-at fault & Fault detection and isolation. The author has an hindex of 8, co-authored 11 publications receiving 595 citations.
Papers
More filters
Journal ArticleDOI
Syndrome-Testable Design of Combinational Circuits
TL;DR: This paper focuses on classical testing of combinational circuits and the large storage requirement for a list of the fault-free response of the circuit to the test set.
Journal ArticleDOI
On Random Pattern Test Length
TL;DR: In this article, the authors examined the problem of fault detection in the presence of nonmasking multiple faults treated, and the question of distinguishing between them is also examined, showing that a test that merely exposes each fault has a high probability of distinguishing the faults.
Journal ArticleDOI
The Weighted Syndrome Sums Approach to VLSI Testing
Barzilai,Savir,Markowsky,Smith +3 more
TL;DR: In this paper, the method of syndrome- testing is applicable toward VLSI testing since it does not require test generation and fault simulation and can be considered as a vehicle for self-testing.
Journal ArticleDOI
Good Controllability and Observability Do Not Guarantee Good Testability
TL;DR: It is shown that good controllability and observability do not guarantee good testability, and one can easily find examples of faults that are difficult or impossible to detect, although both the controllable and observable figures are good.
Journal ArticleDOI
Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection
TL;DR: Intermittent faults in combinational circuits may appear and disappear randomly; hence, their detection requires many repeated applications of test vectors, which requires efficiently minimizing the time required for a test, while still achieving a high degree of fault detection.