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Seiji Higuchi

Researcher at National Institute for Materials Science

Publications -  8
Citations -  129

Seiji Higuchi is an academic researcher from National Institute for Materials Science. The author has contributed to research in topics: Microscope & Electrode. The author has an hindex of 5, co-authored 7 publications receiving 115 citations. Previous affiliations of Seiji Higuchi include Horiba & University of Tsukuba.

Papers
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Journal ArticleDOI

Development and Application of Multiple-Probe Scanning Probe Microscopes

TL;DR: A quadruple-probe AFM (QP-AFM) with four conductive tuning-fork-type self-detection force sensing probes has been developed to measure the conductivity of a nanostructure on an insulating substrate.
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A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials.

TL;DR: The present work shows that the QSPFM has the potential to measure the intrinsic electrical properties of a wide range of microscopic materials in situ without electrode fabrication.
Journal ArticleDOI

Angled long tip to tuning fork probes for atomic force microscopy in various environments

TL;DR: It is revealed that the higher order flexural modes of this TFP are advantageous for FM-AFM in water due to the reduction in the degree of hydrodynamic damping.
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Multiple-scanning-probe tunneling microscope with nanoscale positional recognition function

TL;DR: Improvements make the QSPTM a more practical and useful instrument since four images can now be reliably produced, and consequently the positioning of the four probes becomes easier owing to the reduced chance of accidental contact between the probes.