S
Seiji Higuchi
Researcher at National Institute for Materials Science
Publications - 8
Citations - 129
Seiji Higuchi is an academic researcher from National Institute for Materials Science. The author has contributed to research in topics: Microscope & Electrode. The author has an hindex of 5, co-authored 7 publications receiving 115 citations. Previous affiliations of Seiji Higuchi include Horiba & University of Tsukuba.
Papers
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Journal ArticleDOI
Development and Application of Multiple-Probe Scanning Probe Microscopes
Tomonobu Nakayama,Osamu Kubo,Yoshitaka Shingaya,Seiji Higuchi,Seiji Higuchi,Tsuyoshi Hasegawa,Chun-Sheng Jiang,Taichi Okuda,Yuji Kuwahara,Kazuhiro Takami,Masakazu Aono +10 more
TL;DR: A quadruple-probe AFM (QP-AFM) with four conductive tuning-fork-type self-detection force sensing probes has been developed to measure the conductivity of a nanostructure on an insulating substrate.
Journal ArticleDOI
A quadruple-scanning-probe force microscope for electrical property measurements of microscopic materials.
Seiji Higuchi,Seiji Higuchi,Seiji Higuchi,Osamu Kubo,Hiromi Kuramochi,Masakazu Aono,Tomonobu Nakayama,Tomonobu Nakayama +7 more
TL;DR: The present work shows that the QSPFM has the potential to measure the intrinsic electrical properties of a wide range of microscopic materials in situ without electrode fabrication.
Journal ArticleDOI
Angled long tip to tuning fork probes for atomic force microscopy in various environments
Seiji Higuchi,Hiromi Kuramochi,Osamu Kubo,Shintaro Masuda,Yoshitaka Shingaya,Masakazu Aono,Tomonobu Nakayama +6 more
TL;DR: It is revealed that the higher order flexural modes of this TFP are advantageous for FM-AFM in water due to the reduction in the degree of hydrodynamic damping.
Journal ArticleDOI
A method for combinatorial fabrication and characterization of organic/inorganic thin film devices in UHV.
Journal ArticleDOI
Multiple-scanning-probe tunneling microscope with nanoscale positional recognition function
Seiji Higuchi,Hiromi Kuramochi,Olivier Laurent,Takashi Komatsubara,Shinichi Machida,Masakazu Aono,Kenichi Obori,Tomonobu Nakayama +7 more
TL;DR: Improvements make the QSPTM a more practical and useful instrument since four images can now be reliably produced, and consequently the positioning of the four probes becomes easier owing to the reduced chance of accidental contact between the probes.