S
Shi-Chang Wooh
Researcher at Massachusetts Institute of Technology
Publications - 46
Citations - 1211
Shi-Chang Wooh is an academic researcher from Massachusetts Institute of Technology. The author has contributed to research in topics: Phased array & Ultrasonic sensor. The author has an hindex of 16, co-authored 46 publications receiving 1135 citations.
Papers
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Journal ArticleDOI
Optimum beam steering of linear phased arrays
Shi-Chang Wooh,Yijun Shi +1 more
TL;DR: In this article, a model was developed to compute acoustic pressure distribution of the waves radiated from an ultrasonic linear phased array, and beam directivity and steerability were studied for various transducer parameters such as number of elements, inter-element spacing, element width, and transducers frequency.
Journal ArticleDOI
Beam focusing behavior of linear phased arrays
L. Azar,Y. Shi,Shi-Chang Wooh +2 more
TL;DR: In this article, the authors derived the pressure distribution for beam focusing, and showed that the directivity of focusing converges to that of steering in the far field of the array.
Journal ArticleDOI
Influence of phased array element size on beam steering behavior
Shi-Chang Wooh,Yijun Shi +1 more
TL;DR: In this article, the influence of element width on the ultrasonic beam steering properties was investigated and the beam directivity patterns were analyzed and used as the criteria for determining optimal transducer design parameters.
Journal ArticleDOI
A Simulation Study of the Beam Steering Characteristics for Linear Phased Arrays
Shi-Chang Wooh,Yijun Shi +1 more
TL;DR: In this paper, the influence of various transducer parameters on the beam steering properties is studied, including number of elements, inter-element spacing, element size, frequency of the transducers and the steering angle.
Patent
Ultrasonic defect detection system
Shi-Chang Wooh,Jiyong Wang +1 more
TL;DR: An ultrasonic defect detection system as mentioned in this paper includes a steered beam transmitter and an arithmetic circuit responsive to the location of shadows on the front face for determining the distance between the transmitter and the near and far boundary of the near shadow and at least the near boundary of a far shadow for calculating the location and/or the size and orientation of the defect.