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Shinya Sakurada

Researcher at Toshiba

Publications -  117
Citations -  1124

Shinya Sakurada is an academic researcher from Toshiba. The author has contributed to research in topics: Magnet & Crystal. The author has an hindex of 17, co-authored 116 publications receiving 1029 citations. Previous affiliations of Shinya Sakurada include Arai Helmet.

Papers
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Thermoelectric properties of the TiX(Zr0.5Hf0.5)1 − XNiSn half-Heusler compounds

TL;DR: In this article, the effect of Ti substitution on the thermoelectric properties of (Zr, Hf)NiSn half-Heusler compounds, TiX(Zr0.5Hf 0.5)0.998Sb0.
Journal ArticleDOI

Structural and magnetic properties of rapidly quenched (R,Zr)(Fe,Co)10Nx (R=Nd,Sm)

TL;DR: In this paper, the structural and magnetic properties of (R,Zr)(Fe,Co)10(R=Nd,Sm) prepared by the rapid quenching method have been investigated.
Journal ArticleDOI

Influence of intermediate-heat treatment on the structure and magnetic properties of iron-rich Sm(CoFeCuZr)Z sintered magnets

TL;DR: In this article, intermediate heat treatment (IHT) at temperatures between those of sintering and solution treatment, and evaluated the effects on the macrostructure, microstructure and magnetic properties of Sm(Cobal.Fe0.35Cu0.06Zr0.018)7.8 subjected to IHT at 1453 K.
Journal ArticleDOI

Effects of Solution Treated Temperature on the Structural and Magnetic Properties of Iron-Rich ${\rm Sm}({\rm CoFeCuZr})_{\rm Z}$ Sintered Magnet

TL;DR: In this paper, the effects of solution-treatment temperature on the phase constitution, microstructure and magnetic properties of Sm(Cobal.Fe0.35Cu0.06Zr0.018)7 were investigated systematically.
Patent

Permanent magnet, and motor and power generator using the same

TL;DR: In this paper, a permanent magnet is expressed as a composition expressed by R p Fe q M r Cu s CO 100 p-q-r-s (R is a rare-earth element, M is at least one element selected from Zr, Ti, and Hf, 10 ≤ p ≤ 13.5 at, 25 ≤ q ≤ 40 at, 1.35 ≤ r ≤ 1.75 at%, and 0.88 ≤ s ≤ 13 5 at%); an average thickness of the Cu-rich crystal phases is 20 nm or less, and an average distance between the