scispace - formally typeset
S

Susan N. Ritchey

Researcher at Purdue University

Publications -  5
Citations -  116

Susan N. Ritchey is an academic researcher from Purdue University. The author has contributed to research in topics: Microchannel & Electrical impedance. The author has an hindex of 4, co-authored 5 publications receiving 98 citations.

Papers
More filters
Journal ArticleDOI

Electrical impedance-based void fraction measurement and flow regime identification in microchannel flows under adiabatic conditions

TL;DR: In this paper, an electrical impedance meter is constructed for the measurement of void fraction in micro-channel two-phase flow under adiabatic conditions, and a self-organizing neural network is used for classification of the flow regimes.
Journal ArticleDOI

Local measurement of flow boiling heat transfer in an array of non-uniformly heated microchannels

TL;DR: In this article, an experimental investigation is performed to explore flow boiling phenomena in a microchannel heat sink with hotspots, as well as non-uniform streamwise and transverse peak-heating conditions spanning across the entire heat sink area.
Journal ArticleDOI

Design of a non-intrusive electrical impedance-based void fraction sensor for microchannel two-phase flows

TL;DR: In this paper, a nonintrusive electrical impedance-based sensor is developed for measurement of local void fraction in air-water adiabatic flow through rectangular microchannels.
Journal ArticleDOI

Effects of Non-Uniform Heating on the Location and Magnitude of Critical Heat Flux in a Microchannel Heat Sink

TL;DR: In this paper, the location and magnitude of critical heat flux (CHF) in a micro-channel heat sink exposed to a range of non-uniform heating profiles is measured.
Proceedings ArticleDOI

Impedance-Based Void Fraction Measurement and Flow Regime Identification in Microchannel Flows

TL;DR: In this paper, an electrical impedance meter is constructed for the measurement of void fraction in micro-channel two-phase flow under adiabatic conditions, and the measurements are calibrated against the void fraction measured using analysis of images obtained with a high-speed camera.