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Takashi Kawakubo

Researcher at Toshiba

Publications -  174
Citations -  2957

Takashi Kawakubo is an academic researcher from Toshiba. The author has contributed to research in topics: Electrode & Thin film. The author has an hindex of 30, co-authored 174 publications receiving 2925 citations.

Papers
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Journal ArticleDOI

Thickness Dependence of Ferroelectricity in Heteroepitaxial BaTiO3 Thin Film Capacitors

TL;DR: In this article, a two-step deposition of BaTiO3 films with various thicknesses ranging from 12 nm to 79 nm was performed on SrRuO3/SrTiO 3 substrates by radio-frequency magnetron sputtering.
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Static and Cyclic Fatigue Behavior of a Sintered Silicon Nitride at Room Temperature

TL;DR: In this article, the static and cyclic fatigue behavior of sintered silicon nitride was investigated at room temperature, and it was shown that the minimum time to failure was almost the same, in spite of differences in loading mode or frequency.
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Asymmetric Ferroelectricity and Anomalous Current Conduction in Heteroepitaxial BaTiO3 Thin Films

TL;DR: In this article, asymmetric ferroelectricity and conduction of anomalous leakage current were observed in heteroepitaxial BaTiO3 thin films grown by rf magnetron sputtering at 600° C on three different electrode/substrate combinations: SrRuO3/SrTiO 3, Pt/MgO and Nb doped Sr TiO3.
Patent

Piezoelectric thin film device and method for manufacturing the same

TL;DR: In this article, a piezoelectric thin-film device is described, where one of the crystal axis of the thin film is aligned in a direction perpendicular to a surface of the amorphous metal.
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Corrosion Behavior of Silicon Carbide in 290°C Water

TL;DR: In this paper, the fundamental corrosion behavior of silicon carbide (SiC) ceramics was investigated after immersion in 290°C water solutions with different pH and dissolved-oxygen concentrations.