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Takayuki Narushima

Researcher at Tohoku University

Publications -  210
Citations -  3224

Takayuki Narushima is an academic researcher from Tohoku University. The author has contributed to research in topics: Alloy & Titanium. The author has an hindex of 26, co-authored 202 publications receiving 2598 citations. Previous affiliations of Takayuki Narushima include Lawrence Berkeley National Laboratory & Massachusetts Institute of Technology.

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High‐Temperature Passive Oxidation of Chemically Vapor Deposited Silicon Carbide

TL;DR: In this article, the authors investigated the oxidation behavior of chemically vapor deposited (CVD) SiC at high temperature using a thermogravimetric technique in the temperatures range of 1823 to 1948 K.
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High-Temperature Oxidation of Silicon Carbide and Silicon Nitride

TL;DR: In this paper, two kinds of oxidation (passive and active) and active-to-passive transition of silicon-based ceramics were discussed thermodynamically, and the rate constants of passive/active oxidation and active topassive oxygen potentials for SiC and Si 3 N 4 were reviewed.
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Unique crystallographic texture formation in Inconel 718 by laser powder bed fusion and its effect on mechanical anisotropy

TL;DR: In this paper, a unique texture formation in Inconel 718 (IN718) using a bidirectional laser scan in a laser powder bed fusion (LPBF) process for tailoring the mechanical properties was demonstrated.
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High‐Temperature Active Oxidation of Chemically Vapor‐Deposited Silicon Carbide in an Ar─O2 Atmosphere

TL;DR: In this paper, the authors examined the active oxidation behavior of chemically vapor-deposited silicon carbide in an O2 atmosphere at 0.1 MPa in the temperature range between 1840 and 1923 K.
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High‐Temperature Oxidation of Chemically Vapor‐Deposited Silicon Carbide in Wet Oxygen at 1823 to 1923 K

TL;DR: In this article, a thermogravimetric analysis of chemically vapor-deposited SiC in wet O2 was performed in the temperature range of 1823 to 1923 K. The activation energies of linear and parabolic rate constants were 428 and 397 kJ · mol−1, respectively, and it was shown that the rate controlling step is a chemical reaction at an SiC/SiO2 interface in the linear oxidation regime, and the rate-controlling step is an oxygen diffusion process through the oxide film (cristobalite) in the parabolic