T
Takeo Sawatari
Researcher at Bendix Corporation
Publications - 10
Citations - 191
Takeo Sawatari is an academic researcher from Bendix Corporation. The author has contributed to research in topics: Signal & Stylus. The author has an hindex of 7, co-authored 10 publications receiving 189 citations.
Papers
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Journal ArticleDOI
Optical Heterodyne Scanning Microscope
TL;DR: A new optical heterodyne scanning microscope is described in which both the illumination beam and reference beam scan the object in synchronization, which has additional advantages in that the object illumination can be at least one order of magnitude less intense and that ambient light has no effect for images.
Patent
Low angle radar processing means
TL;DR: In this article, the elevation angle of a low angle target is accurately measured by subtracting from the received radar signal signals derived from an estimated value of target elevation which reduces the resulting signal to a minimum.
Patent
Surface profile measuring device and method
TL;DR: In this paper, an arrangement for measuring the profile of surfaces having a characteristic one-directional lay with sufficient resolution to determine the surface roughness thereof is disclosed, comprising a device for illuminating a small spot on the surface, with an image of the spot projected through an objective lens onto a large area light detector positioned to generate a signal corresponding to the total illumination produced by the image.
Journal ArticleDOI
Fresnel-Zone-Plate Spectrometer with Central Stop*
TL;DR: In this paper, the effect of a central stop over the low-order rings of a Fresnel zone plate lens was analyzed, and it was shown that the central stop can markedly improve the rejection of frequencies outside the pass band without significant degradation of the spectrometer resolution.
Journal ArticleDOI
Optical Profile Transducer
Takeo Sawatari,Richard B. Zipin +1 more
TL;DR: The profile transducer as mentioned in this paper consists of a microscope objective, a point-source illuminator, and two photodetectors, and it can measure the profile of machined surfaces.