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Thorsten U. Kampen

Researcher at Max Planck Society

Publications -  97
Citations -  2002

Thorsten U. Kampen is an academic researcher from Max Planck Society. The author has contributed to research in topics: Raman spectroscopy & Thin film. The author has an hindex of 24, co-authored 97 publications receiving 1947 citations. Previous affiliations of Thorsten U. Kampen include Chemnitz University of Technology & Fritz Haber Institute of the Max Planck Society.

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Barrier height engineering of Ag/GaAs(100) Schottky contacts by a thin organic interlayer

TL;DR: In this article, thin films of 3,4,9,10-perylenetetetracarboxylic dianhydride (PTCDA) were used as an interlayer for the electronic modification of Ag/ n -GaAs(100) Schottky contacts.
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Resonant Raman spectroscopy of 3,4,9,10-perylene-tetracarboxylic-dianhydride epitaxial films

TL;DR: In this paper, a comprehensive investigation of Raman-active modes of 3,4,9,10-perylene-tetracarboxylic-dianhydride (PTCDA) thin films deposited on H-passivated Si(111) substrates is presented.
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Schottky contacts on passivated GaAs(1 0 0) surfaces: barrier height and reactivity

TL;DR: In this article, the experimental and theoretical investigations of metal contacts on chalcogen passivated GaAs(1.0.0) surfaces were conducted and it was shown that depending on the metal used for the contact formation, the passivation reduced the interaction between metals and GaAs.
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Transport gap of organic semiconductors in organic modified Schottky contacts

TL;DR: In this article, two different organic molecules with similar structure, 3,4,9,10-perylenetetetricarboxylic dianhydride (PTCDA) and N, N '-dimethyl-3, 4, 9, 10, 10-perYLenetetrarboxyl diimide (DiMe-PTCDI), were used for the modification of Ag Schottky contacts on sulphur passivated GaAs (S-GaAs).
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Experimental investigation and simulation of hybrid organic/inorganic Schottky diodes

TL;DR: In this paper, the I-V characteristics of Ag/PTCDA/GaAs Schottky diodes as a function of PTCDA thickness and compared the results with experimental in situ measurements.