There is, I think, something ethereal about i —the square root of minus one. I remember first hearing about it at school. It seemed an odd beast at that time—an intruder hovering on the edge of reality.

Usually familiarity dulls this sense of the bizarre, but in the case of i it was the reverse: over the years the sense of its surreal nature intensified. It seemed that it was impossible to write mathematics that described the real world in …

I and i

J. Appl. Cryst.の発刊に際して

http://www.uniroma2.it/didattica/tbs2/deposito/Manufacture,_characterisation_and_application_of_cellular_metals_and_metal_foams.pdf

Manufacture, characterisation and application of cellular metals and metal foams

Thank you for reading principles of optics electromagnetic theory of propagation interference and diffraction of light. As you may know, people have search hundreds times for their favorite novels like this principles of optics electromagnetic theory of propagation interference and diffraction of light, but end up in harmful downloads. Rather than enjoying a good book with a cup of coffee in the afternoon, instead they are facing with some infectious bugs inside their computer.

Principles Of Optics Electromagnetic Theory Of Propagation Interference And Diffraction Of Light

Interpretation of X-ray Powder Diffraction Patterns . By H. Lipson and H. Steeple. Pp. viii + 335 + 3 plates. (Mac-millan: London; St Martins Press: New York, May 1970.) £4.

X-Ray Diffraction

Part 1 Experimental realization: basic elements of an equipment resolution elements diffractometers and reflectometers. Part 2 The theory of X-ray diffraction and its realization by the experiment: kinematical X-ray scattering from ideal crystals kinematical X-ray diffraction from deformed thin layers kinematical X-ray diffraction from randomly disturbed layers dynamical X-ray diffraction in perfect layers dynamical X-ray diffraction in slightly deformed layers optical reflection of X-rays from ideal layers optical reflection of X-rays from layers with rough interfaces dynamical X-ray diffraction in strongly asymmetric cases grazing incidence diffraction (GID). Appendices: elements of the formal theory of scattering structure factors, dispersion corrections and extinction length.

/pdf/high-resolution-x-ray-scattering-from-thin-films-and-2cq3a8xz6p.pdf

High-Resolution X-Ray Scattering from Thin Films and Multilayers

X-ray reflection from periodical multilayers with randomly rough interfaces has been described within the distorted-wave Born approximation. The method is suitable for calculating both specular x-ray reflection and nonspecular (diffuse) scattering. In this paper, both in-plane and vertical correlations of the roughness profiles have been considered and it has been demonstrated that the vertical roughness correlation substantially affects the nonspecular scattering. The theory can explain resonant effects observed in the beam scattered nonspecularly from a periodical multilayer. The theoretical approach has been used for the study of interfacial roughness in a long-periodic AlAs/GaAs multilayer and good agreement has been achieved between the experimental results and the theory.

Nonspecular x-ray reflection from rough multilayers.

The first € price and the £ and $ price are net prices, subject to local VAT. Prices indicated with * include VAT for books; the €(D) includes 7% for Germany, the €(A) includes 10% for Austria. Prices indicated with ** include VAT for electronic products; 19% for Germany, 20% for Austria. All prices exclusive of carriage charges. Prices and other details are subject to change without notice. All errors and omissions excepted. U. Pietsch, V. Holy, T. Baumbach High-Resolution X-Ray Scattering

High-Resolution X-Ray Scattering

1 Elements for Designing an X-Ray Diffraction Experiment.- 2 Diffractometers and Reflectometers.- 3 Scans and Resolution in Angular and Reciprocal Space.- 4 Basic Principles.- 5 Kinematical Theory.- 6 Dynamical Theory.- 7 Semikinematical Theory.- 8 Determination of Layer Thicknesses of Single Layers and Multilayers.- 9 Lattice Parameters and Strains in Epitaxial Layers and Multilayers.- 10 Diffuse Scattering From Volume Defects in Thin Layers.- 11 X-Ray Scattering by Rough Multilayers.- 12 X-Ray Scattering by Artificially Lateral Semiconductor Nanostructures.- 13 Strain Analysis in Periodic Nanostructures.- 14 X-Ray Scattering from Self-Organized Structures.- References.

High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures

Biofilms represent a fundamental problem in environmental biology, water technology, food hygiene as well as in medical and technical systems. Recently introduced slippery liquid-infused porous surface (SLIPS) showed great promise for preventing biofilm formation owing to the low surface energy of such surface in combination with its self-cleaning properties. In this study we demonstrated a novel hydrophobic liquid-infused porous poly(butyl methacrylate-co-ethylene dimethacrylate) surface (slippery BMA-EDMA) with bacteria-resistance in BM2 mineral medium and long-term stability in aqueous environments. We showed that the slippery BMA-EDMA surface prevents biofilm formation of different strains of opportunistic pathogen Pseudomonas aeruginosa for at least up to 7 days in low nutrient medium. Only ∼1.8% of the slippery surface was covered by the environmental P. aeruginosa PA49 strain under investigation. In uncoated glass controls the coverage of surfaces reached ∼55% under the same conditions. However, in...

Tilo Baumbach

Papers

High-Resolution X-Ray Scattering from Thin Films and Multilayers

Nonspecular x-ray reflection from rough multilayers.

High-Resolution X-Ray Scattering

High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures

Hydrophobic Liquid-Infused Porous Polymer Surfaces for Antibacterial Applications