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Ullrich Pietsch

Researcher at Folkwang University of the Arts

Publications -  358
Citations -  6933

Ullrich Pietsch is an academic researcher from Folkwang University of the Arts. The author has contributed to research in topics: Diffraction & Scattering. The author has an hindex of 33, co-authored 354 publications receiving 6485 citations. Previous affiliations of Ullrich Pietsch include European Synchrotron Radiation Facility & University of Siegen.

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Book

High-Resolution X-Ray Scattering from Thin Films and Multilayers

TL;DR: In this article, the theory of X-ray diffraction and its realization by the experiment is presented, including basic elements of an equipment resolution elements diffractometers and reflectometers.
BookDOI

High-Resolution X-Ray Scattering

TL;DR: The first € price and the £ and $ price are net prices, subject to local VAT as discussed by the authors, and the first £ and £ price is net price subject to the local VAT.
Journal ArticleDOI

Effect of Molecular Weight on the Structure and Crystallinity of Poly(3-hexylthiophene)

TL;DR: In this article, the results of detailed investigations of powders and thin films of deuterated poly(3-hexylthiophene) (P3HT) fractions with different molecular weight were presented.
Book

High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures

TL;DR: In this paper, the authors present an X-ray diffraction experiment using Diffractometers and reflectometers. But they do not consider the effects of scattering from volume defects in thin layers and multilayers.