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Tsuneo Furuyama

Researcher at Nippon Telegraph and Telephone

Publications -  5
Citations -  52

Tsuneo Furuyama is an academic researcher from Nippon Telegraph and Telephone. The author has contributed to research in topics: Software quality & Software development. The author has an hindex of 2, co-authored 5 publications receiving 49 citations.

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Fault generation model and mental stress effect analysis

TL;DR: Fault generation models based on a software development model are described and shown to be consistent with the results of an analysis of data collected from fault reports and thorough interviews with software developers, that is, designers and programmers.
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Analysis of fault generation caused by stress during software development

TL;DR: The results of the analysis show that physical stress could generate faults at a higher rate than mental stress even when it appeared for a short period, independent of design methodology.

A manifold growth model that unifies software reliability growth models

TL;DR: This model makes it possible to predict the number of remaining faults for complicated fault growth curves with higher accuracy than previously, in addition to reducing the labor in selecting the most suitable model for each growth curve.
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Metrics for measuring the effect of mental stress on fault generation during software development

TL;DR: The effects of mental stress on fault-generation are quantitatively determined through a controlled experiment, where two teams develop the same software program under the same conditions, except for mental stress.
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A manifold growth model that unifies software reliability growth models

TL;DR: In this paper, a manifold model that unifies existing software reliability growth models (SRGMs) is presented, in addition to reducing the labor in selecting the most suitable model for each growth curve, making it possible to predict the number of remaining faults for complicated fault growth curves with higher accuracy than previously.