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Yoshio Arai
Researcher at Nippon Telegraph and Telephone
Publications - 3
Citations - 50
Yoshio Arai is an academic researcher from Nippon Telegraph and Telephone. The author has contributed to research in topics: Software quality & Fault (power engineering). The author has an hindex of 2, co-authored 3 publications receiving 47 citations.
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Fault generation model and mental stress effect analysis
TL;DR: Fault generation models based on a software development model are described and shown to be consistent with the results of an analysis of data collected from fault reports and thorough interviews with software developers, that is, designers and programmers.
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Analysis of fault generation caused by stress during software development
TL;DR: The results of the analysis show that physical stress could generate faults at a higher rate than mental stress even when it appeared for a short period, independent of design methodology.
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Metrics for measuring the effect of mental stress on fault generation during software development
TL;DR: The effects of mental stress on fault-generation are quantitatively determined through a controlled experiment, where two teams develop the same software program under the same conditions, except for mental stress.