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Uditha Balasooriya
Researcher at Nanyang Technological University
Publications - 36
Citations - 643
Uditha Balasooriya is an academic researcher from Nanyang Technological University. The author has contributed to research in topics: Order statistic & Censoring (clinical trials). The author has an hindex of 12, co-authored 36 publications receiving 577 citations. Previous affiliations of Uditha Balasooriya include National University of Singapore & Memorial University of Newfoundland.
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Journal ArticleDOI
Progressively Censored Reliability Sampling Plans for the Weibull Distribution
TL;DR: This article presents progressively censored variable sampling plans for the Weibull distribution, based on data reported by Montanari and Cacciari from progressively censored aging tests on XLPE-insulated cable models.
Journal ArticleDOI
Reliability sampling plans for lognormal distribution, based on progressively-censored samples
TL;DR: The progressively censored reliability sampling plans for the lognormal distribution based on progressively censored samples are presented and general application of the procedure is discussed, and two examples are provided.
Journal ArticleDOI
Failure–censored reliability sampling plans for the exponential distribution
TL;DR: In this paper, failure-censored sampling plans for the two-parameter exponential distri- bution based on m random samples, each of size n, were examined and compared with ordinary sampling plans using a sample of size mn.
Journal ArticleDOI
Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring
Uditha Balasooriya,C.-K. Low +1 more
TL;DR: Type I progressively censored variable-sampling plans for Weibull lifetime distributions under competing causes of failure are discussed and the proposed procedure is attractive as it yields useful degradation-related information for improving product quality.
Journal ArticleDOI
Reliability sampling plans for the two-parameter exponential distribution under progressive censoring
TL;DR: In this paper, the authors present reliability sampling plans for the two-parameter exponential distribution under progressive censoring, which are quite useful to practitioners, because they provide savings in resources and in total test time.