scispace - formally typeset
V

V. Celli

Researcher at University of Virginia

Publications -  119
Citations -  4608

V. Celli is an academic researcher from University of Virginia. The author has contributed to research in topics: Scattering & Inelastic scattering. The author has an hindex of 31, co-authored 119 publications receiving 4416 citations. Previous affiliations of V. Celli include University of Illinois at Urbana–Champaign & Helsinki University of Technology.

Papers
More filters
Journal ArticleDOI

Electron-phonon coupling and electron heat capacity of metals under conditions of strong electron-phonon nonequilibrium

TL;DR: In this article, the dependence of the strength of the electron-phonon coupling and the electron heat capacity on the electron temperature was investigated for eight representative metals, Al, Cu, Ag, Au, Ni, Pt, W, and Ti.
Journal ArticleDOI

Theory of Dislocation Mobility in Semiconductors

TL;DR: In this article, a new model for dislocation motion appropriate for crystals having high Peierls stress is presented, which makes use of dragging points on the dislocation which restrict the free motion of kinks on the line.
Journal ArticleDOI

Optical properties of rough surfaces: General theory and the small roughness limit

TL;DR: In this paper, the diffraction of electromagnetic waves from the rough surface of a material of finite permittivity is examined for the case where the wavelength of the incident radiation is comparable to the dimensions of the surface roughness.
Journal ArticleDOI

Scattering of atoms by solid surfaces. I

TL;DR: In this article, a quantum mechanical theory of the scattering of atoms by solid surfaces is presented, which is applied to a detailed discussion of elastic scattering (diffraction) processes, and the extension to inelastic scattering (phonon exchange) processes is discussed briefly.
Journal ArticleDOI

Localization effects in the scattering of light from a randomly rough grating

TL;DR: This localization of surface polaritons due to the surface roughness is found to contribute a maximum to the angular dependence of the intensity of the nonspecularly reflected light in the antispecular direction.