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Vijay Srinivasan

Researcher at National Institute of Standards and Technology

Publications -  59
Citations -  992

Vijay Srinivasan is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Least squares & Geodetic datum. The author has an hindex of 19, co-authored 59 publications receiving 906 citations. Previous affiliations of Vijay Srinivasan include Columbia University & University of North Carolina at Charlotte.

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Journal ArticleDOI

Standardizing the specification, verification, and exchange of product geometry: Research, status and trends

TL;DR: The current state of the interplay between the efforts of these two ISO committees, research work that was undertaken to meet the goals of their standards and plans to address future challenges are described.
Journal ArticleDOI

A Portrait of an ISO STEP Tolerancing Standard as an Enabler of Smart Manufacturing Systems

TL;DR: In this paper, the authors describe the attributes of smart manufacturing systems, the capabilities of STEP AP 242 in handling tolerance information associated with product geometry, and how these capabilities enable the manufacturing systems to be smart.

A portrait of an ISO STEP tolerancing standard as an enabler of smart manufacturing systems | NIST

TL;DR: The attributes of smart manufacturing systems, the capabilities of STEP AP 242 in handling tolerance information associated with product geometry, and how these capabilities enable the manufacturing systems to be smart are described.
Book ChapterDOI

An Integrated View of Geometrical Product Specification and Verification

TL;DR: An integrated view of tolerancing and metrology is presented, and the new vision of ISO/TC 213 is described, which addresses the need for linking these two areas to product functionality.
Journal ArticleDOI

Computational metrology for the design and manufacture of product geometry : A classification and synthesis

TL;DR: This paper presents the status of research and standardization efforts in computational metrology, with an emphasis on its classification and synthesis.