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Vikram Chaturvedi

Researcher at Delft University of Technology

Publications -  9
Citations -  69

Vikram Chaturvedi is an academic researcher from Delft University of Technology. The author has contributed to research in topics: Electromagnetic coil & Capacitive sensing. The author has an hindex of 4, co-authored 9 publications receiving 44 citations.

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Journal ArticleDOI

A 19.8-mW Eddy-Current Displacement Sensor Interface With Sub-Nanometer Resolution

TL;DR: This paper presents an eddy-current sensor (ECS) interface intended for sub-nanometer (sub-nm) displacement sensing in hi-tech applications that employs a 126-MHz excitation frequency to mitigate the skin effect, and achieve high resolution and stability.
Journal ArticleDOI

Demodulation Techniques for Self-Oscillating Eddy-Current Displacement Sensor Interfaces: A Review

TL;DR: In this article, a comprehensive study of demodulation techniques for high-frequency self-oscillating eddy-current displacement sensor (ECDS) interfaces is presented, where the authors analyze noise, linearity, and stability design considerations in amplitude demodulators for nanometer and sub-nanometer ECDSs.
Proceedings ArticleDOI

A 9.1 mW inductive displacement-to-digital converter with 1.85 nm resolution

TL;DR: A displacement-to-digital converter (DDC) based on inductive (eddy-current) sensor is presented, which draws 9.1mW from a 1.8 V supply making it the most energy-efficient ECS interface ever reported.
Journal ArticleDOI

Suppression Efficiency of the Correlated Noise and Drift of Self-oscillating Pseudo-differential Eddy Current Displacement Sensor

TL;DR: In this paper, the suppression efficiency of the correlated noise and drift of self-oscillating front-end circuit in a pseudo-differential eddy-current displacement sensor (ECDS) is investigated using COMSOL and MATLAB.
Proceedings ArticleDOI

9.9 A 0.6nm resolution 19.8mW eddy-current displacement sensor interface with 126MHz excitation

TL;DR: Displacement sensing with sub-nanometer resolution is required in advanced metrology and high-tech industry, e.g., to measure the lens position in wafer scanners and calls for stable flat sensing coils in close proximity to the ECS interface.