V
Viktor A. Podolskiy
Researcher at University of Massachusetts Lowell
Publications - 255
Citations - 10579
Viktor A. Podolskiy is an academic researcher from University of Massachusetts Lowell. The author has contributed to research in topics: Metamaterial & Plasmon. The author has an hindex of 48, co-authored 249 publications receiving 9912 citations. Previous affiliations of Viktor A. Podolskiy include Oregon State University & University of Massachusetts Amherst.
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Proceedings ArticleDOI
Angle-independent Salisbury screens based on nonlocal nanowire metamaterials
TL;DR: In this article, nonlocal nanowire metamaterials can help to alleviate one of the main limitations of Salisbury screens, their dependence on the incident angle, and they demonstrate that non-local nano-materials can improve the performance of the Salisbury screen.
Proceedings ArticleDOI
Imaging properties of anisotropy-based negative index composites
TL;DR: In this article, a detailed study of optical properties of nonmagnetic, nonperiodic planar materials with negative refractive index was presented, and the possibility of achieving far-field resolution below the free-space diffraction limit in these systems was demonstrated.
Proceedings ArticleDOI
Non-magnetic System with Negative Index of Refraction for Terahertz Application
TL;DR: In this paper, a non-magnetic system with negative refraction index for terahertz applications is proposed based on a planar metallic waveguide with bismuth core.
Proceedings ArticleDOI
Evolution of beaming pattern in corrugated mid-IR plasmonic structures
TL;DR: In this paper, the formation of highly directional beams from a subwavelength aperture surrounded by surface corrugations through a high-index superstrate was considered and it was shown that the beaming pattern strongly depends on the distance to the aperture.
Proceedings ArticleDOI
Modeling asymmetric reflectance in semicontinuous metal films using generalized Ohm's Law
TL;DR: In this paper, generalized Ohm's Law is used to model the phenomenon of broadband asymmetric reflectance observed in semicontinuous metal-dielectric films in the proximity of the percolation threshold.