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Showing papers by "Vincent Ji published in 1998"


Journal ArticleDOI
Y.G. Zhang1, X.Y. Li1, C.Q. Chen1, W. Wang1, Vincent Ji2 
TL;DR: In this article, the influence of Nb ion implantation with different doses upon microhardness and high-temperature oxidation resistance of a Ti-48 at.% Al alloy was investigated.
Abstract: The influence of Nb ion implantation with different doses upon microhardness and high-temperature oxidation resistance of a Ti-48 at.% Al alloy was investigated. The results showed that the surface microhardness of the alloy was significantly increased by Nb implantation with doses from 3 × 10 15 ions cm −2 to 3 × 10 16 ions cm −2 , and reached a constant level at a dose of 3 × 10 17 ions cm −2 . The isothermal oxidation resistance of the alloy at 900 °C and 950 °C in an atmospheric environment could be remarkably improved by Nb ion implantation with a dose of 3 × 10 17 ions cm −2 , which was attributed to the effect of the implanted Nb atoms on the nucleation and formation of the oxides and the oxidation scale microstructure. The influence of both the primary and secondary effects of Nb ion implantation upon the microhardness and oxidation behavior of Ti-48 at.% Al alloy is discussed.

22 citations


Journal ArticleDOI
TL;DR: The yield strength of a metallic technological surface with biaxial residual stresses may be determined using X-ray stress analysis techniques as discussed by the authors, and it can be concluded that for a metallic material in the hard state, the half width parameter of the X -ray interference lines at the surface does not correctly reflect static strength.
Abstract: The yield strength of a metallic technological surface with biaxial residual stresses may be determined using X-ray stress analysis techniques. Shot peening can increase the superficial proof stresses of a spring steel treated in the hard state, even though there is a considerable decrease in the half width of the X-ray diffraction profile. It can therefore be concluded that for a metallic material in the hard state, the half width parameter of the X -ray interference lines at the surface does not correctly reflect static strength.

13 citations