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Vincent Maurice

Researcher at Chimie ParisTech

Publications -  138
Citations -  6436

Vincent Maurice is an academic researcher from Chimie ParisTech. The author has contributed to research in topics: Oxide & Corrosion. The author has an hindex of 46, co-authored 123 publications receiving 5673 citations. Previous affiliations of Vincent Maurice include Center for Advanced Materials & Franche Comté Électronique Mécanique Thermique et Optique Sciences et Technologies.

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Localized corrosion (pitting): A model of passivity breakdown including the role of the oxide layer nanostructure

TL;DR: A model of passivity breakdown including the role of the intergranular boundaries of the barrier oxide layer on the redistribution of the potential at the metal/oxide/electrolyte interfaces in the passive state is presented in this paper.
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X‐Ray Photoelectron Spectroscopy and Scanning Tunneling Microscopy Study of Passive Films Formed on (100) Fe‐18Cr‐13Ni Single‐Crystal Surfaces

TL;DR: In this paper, X-ray photoelectron spectroscopy (XPS) and scanning tunneling microscopy (STM) were combined to investigate the thickness, chemical composition, and structure of passive films formed in 0.5 M H 2 SO 4 on (100)Fe-18Cr-13Ni.
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XPS and STM study of the growth and structure of passive films in high temperature water on a nickel-base alloy

TL;DR: The early stages of passivation in high temperature water of a nickel-chromium-iron alloy (Alloy 600) have been investigated by X-ray Photoelectron Spectroscopy (XPS) and Scanning Tunneling Microscopy (STM) as mentioned in this paper.
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Low-temperature atomic layer deposition of Al2O3 thin coatings for corrosion protection of steel: Surface and electrochemical analysis

TL;DR: In this article, the anti-corrosion properties of thin (10, 50 and 100 nm) alumina coatings grown by atomic layer deposition at 160°C on steel is reported.
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XPS and STM Study of Passive Films Formed on Fe‐22Cr(110) Single‐Crystal Surfaces

TL;DR: In this paper, X-ray photoelectron spectroscopy and ex situ scanning tunneling microscopy measurements have been combined to investigate the thickness, the chemical composition, and the structure of passive films formed in 0.5 M H{sub 2}SO{sub 4} on Fe-22Cr(110).