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Vincenzo Piuri

Researcher at University of Milan

Publications -  446
Citations -  7405

Vincenzo Piuri is an academic researcher from University of Milan. The author has contributed to research in topics: Fault tolerance & Biometrics. The author has an hindex of 39, co-authored 416 publications receiving 6280 citations. Previous affiliations of Vincenzo Piuri include Fiat Automobiles & Instituto Politécnico Nacional.

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Fault-tolerant techniques for VLSI tree structures

TL;DR: A new approach to design fault-tolerant VLSI tree architectures that allocates spare processors at each level and at the bottom and creates deformation lines that introduce correspondences between the faulty elements and the spare ones.
Proceedings Article

Paradigm-independent design of composite systems

TL;DR: The purpose is to bring codesign concepts to early phases of design, reframing them to fit with paradigms instead of implementation, and highlighting the requirements of this innovative approach and the tools needed to perform it.
Journal ArticleDOI

Guest Editorial Special Issue on Advanced Cognitive Computing for Data-Driven Computational Social Systems

TL;DR: Computational social systems (CSSs) focus on topics such as modeling, simulation, analysis, and understanding of social systems from the quantitative and/or computational perspective as discussed by the authors , which can be man-man, man-machine, and machine-machine organizations and adversarial situations as well as social media structures and their dynamics.
Proceedings ArticleDOI

Photovoltaic Energy Prediction for New-Generation Cells with Limited Data: A Transfer Learning Approach

TL;DR: This paper proposes the first approach in the literature based on machine learning and transfer learning for the PV energy prediction, in the case of new-generation PV technologies for which limited training data is available.

Bit-Modular Defectmault-Tolerant Convolvers

TL;DR: Design of a family of high-throughput modular convolvers is discussed, with particular reference to the defect and fault tolerance issues, based on parallel computation for the individual operands’ bits with merged results.