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W.W. Milligan
Researcher at Michigan Technological University
Publications - 42
Citations - 2678
W.W. Milligan is an academic researcher from Michigan Technological University. The author has contributed to research in topics: Grain size & Deformation mechanism. The author has an hindex of 24, co-authored 42 publications receiving 2377 citations. Previous affiliations of W.W. Milligan include Aristotle University of Thessaloniki & Georgia Institute of Technology.
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Journal ArticleDOI
Strengthening Mechanisms in Polycrystalline Multimodal Nickel-Base Superalloys
R.W. Kozar,Akane Suzuki,Akane Suzuki,W.W. Milligan,J. J. Schirra,M. F. Savage,Tresa M. Pollock +6 more
TL;DR: In this paper, a model that considers solid-solution strengthening, Hall-Petch effects, precipitate shearing in the strong and weak pair-coupled modes, and dislocation bowing between precipitates has been developed and assessed.
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Strength and tension/compression asymmetry in nanostructured and ultrafine-grain metals
TL;DR: In this paper, a simple model for the strength in this regime of grain sizes is developed from classical dislocation theory, based on the bow-out of a dislocation from a grain boundary dislocation source.
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Investigation of creep deformation mechanisms at intermediate temperatures in René 88 DT
TL;DR: In this article, the authors investigated the deformation properties of the superalloy Rene 88 DT alloys with small-strain (0.2-0.5%) creep at 650°C using conventional and high-resolution transmission electron microscopy.
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Observation and measurement of grain rotation and plastic strain in nanostructured metal thin films
TL;DR: In this article, the deformation behavior of nanostructured gold thin films, with grain diameters of 10 nm and film thicknesses of 10-20 nm, was studied by means of in situ high-resolution transmission electron microscopy.
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Mechanical behavior of a bulk nanostructured iron alloy
TL;DR: In this article, the Hall-Petch equation was used to model the behavior of fine-grained Fe-10Cu powders with grain diameters between 45 nm and 1.7 µm.