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Wayne D. Kaplan

Researcher at Technion – Israel Institute of Technology

Publications -  173
Citations -  5104

Wayne D. Kaplan is an academic researcher from Technion – Israel Institute of Technology. The author has contributed to research in topics: Transmission electron microscopy & Grain boundary. The author has an hindex of 34, co-authored 171 publications receiving 4633 citations. Previous affiliations of Wayne D. Kaplan include United States Department of Veterans Affairs & Max Planck Society.

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Book

Microstructural Characterization of Materials

TL;DR: In this paper, the authors introduce the concept of the Scanning electron microscope and its application in the field of microscopy, including the following: 1.1. The Concept of Microstructure. 2.2.
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Ordered Liquid Aluminum at the Interface with Sapphire

TL;DR: Evidence for ordering of liquid atoms adjacent to an interface with a crystal is provided, based on real-time high-temperature observations of alumina-aluminum solid-liquid interfaces at the atomic-length scale.
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A review of wetting versus adsorption, complexions, and related phenomena: the rosetta stone of wetting

TL;DR: A review of the fundamental concepts and terminology of wetting can be found in this paper, where the role of chemistry and structure of interfaces and free surfaces on wetting phenomena are addressed.
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Laser cladding of turbine blades

TL;DR: In this article, a comparative study of two different techniques for the application of wear-resistant coatings for contact surfaces of shroud shelves of gas turbine engine blades (GTE) has been conducted.
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Oscillatory Mass Transport in Vapor-Liquid-Solid Growth of Sapphire Nanowires

TL;DR: In situ transmission electron microscopy observed a different behavior for self-catalytic VLS growth of sapphire nanowires, which occurs in a layer-by-layer fashion and is accomplished by interfacial diffusion of oxygen through the ordered liquid aluminum atoms.