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William F. Guthrie

Researcher at National Institute of Standards and Technology

Publications -  80
Citations -  1716

William F. Guthrie is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: NIST & Calibration. The author has an hindex of 19, co-authored 80 publications receiving 1617 citations.

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Nanoindentation of polymers: an overview

TL;DR: A review of the application of instrumented indentation devices to the measurement of the elastic modulus of polymeric materials is reviewed in this paper, which includes a summary of traditional analyses of load-penetration data and a discussion of associated uncertainties.
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An Approach to Combining Results From Multiple Methods Motivated by the ISO GUM.

TL;DR: The problem of determining a consensus value and its uncertainty from the results of multiple methods or laboratories is discussed and a Bayesian hierarchical model motivated by the proposed solution is presented and compared to the solution.
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Traceable calibration of critical-dimension atomic force microscope linewidth measurements with nanometer uncertainty

TL;DR: In this article, the authors used single-crystal silicon and preferential etching to pattern well-defined and highly uniform features, and the use of high resolution transmission electron microscopy (HRTEM) to access the Si lattice spacing directly as a source of traceable width information.