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William H. Woodall
Researcher at Virginia Tech
Publications - 222
Citations - 19025
William H. Woodall is an academic researcher from Virginia Tech. The author has contributed to research in topics: Control chart & Statistical process control. The author has an hindex of 67, co-authored 209 publications receiving 17692 citations. Previous affiliations of William H. Woodall include University of Alabama.
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A Review and Critique of Auxiliary Information-Based Process Monitoring Methods.
TL;DR: In this article, the authors review the literature on auxiliary information-based (AIB) process monitoring methods and show that violations of this assumption can have serious adverse effects both when the process is stable and when there has been a process shift.
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A note on an average run length calculation for the EWMA and other charts
Abdul Haq,William H. Woodall +1 more
TL;DR: In this article , the authors show that these approximations, presented in the literature as being exact, can be very inaccurate when compared with the true ARL values, and that the use of these poor ARL approximation has led to many flawed articles, which should be either corrected or retracted.
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Bivariate dispersion quality control charts
Kwami Tuprah,William H. Woodall +1 more
TL;DR: In this article, a Shewhart procedure is used to simultaneously control the standard deviations of quality characteristics assumed to have a bivariate normal distribution, and it is shown that signals occur only slightly more quickly for changes in the process standard deviations for uncorrected variables than for correlated variables.
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[Shewhart-Type Charts in Nonstandard Situations]: Discussion
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Equivalences between multiple dependent state sampling, chain sampling, and control chart runs rules
TL;DR: In this paper , the authors show that the MDSS feature is an extension of chain sampling in acceptance sampling applications, and that use of the multiple dependent state sampling (MDSS) feature with control charts is equivalent to the use of standard supplementary runs rules.